Saltar al contenido

RAD-HARQ (IPT-2012-0422-370000)

Desarrollo de tecnología resistente a la radiación para microelectrónica espacial

(Development of resistant radiation technology for space microelectronics)

Summary

El presente proyecto tiene como objetivo el desarrollo de una biblioteca de señal mixta (analógica y digital) de uso general en ASICs resistentes a la radiación para espacio basado en la tecnología europea (ONSEMI) con posibilidades de migración a otras tecnologías

Participants

Publications

PhD Thesis
  1.  “Modeling and design of ring oscillators and their application in radiation environments“, Javier Agustín Sáenz. 2017.
  2. “Fault management techniques for systems with SRAM-based FPGAs“, Ignacio Herrera Alzu, 2015.
Journal Papers
  1. “Efficient Mitigation of SET Induced Harmonic Errors in Ring Oscillators“, J. A gustin, M. Lopez-Vallejo, C. G. Soriano, P. Cholbi, L. W. Massengill and Y. P. Chen, IEEE Transactions on Nuclear Science, vol. 62, no 6, p. 3049-3056, Dec. 2015. Impact Factor 2015: 1.198.
  2. “An In-Depth Analysis of Ring Oscillators: Exploiting Their Configurable Duty-Cycle“, J. Agustin, M. L. Lopez-Vallejo, IEEE Transactions on Circuits and Systems I: Regular Papers, I, vol. 62, no 10, p. 2485-2494, Oct. 2015. Impact Factor (2015): 2,393.
  3. “Design and Characterization of a Built-In CMOS TID Smart Sensor“, J. Agustin, C. Gil, M. Lopez-Vallejo, P. Ituero, IEEE Transactions on Nuclear Science, vol.62, no.2, pp. 443-450, April 2015. Impact Factor 2015: 1.198.
Conference papers
  1. “Efficient Mitigation of SET Induced Harmonic Errors in Ring Oscillators”, J. Agustin, M. Lopez-Vallejo, L. W. Massengill, IEEE Nuclear and Space Radiation Effects Conference, Boston, USA, July 2015.
  2. “Evolution of radiation-induced soft errors in FinFET SRAMs under process variations beyond 22nm“, P. Royer, F. Garcia-Redondo, M. Lopez-Vallejo, in IEEE/ACM International Symposium on Nanoscale Architectures, pp.112-117, 8-10 July 2015.
  3. “A built-in CMOS Total Ionization Dose smart sensor“, J. Agustin, C. G. Soriano, M. Lopez Vallejo, P. Ituero, IEEE Sensors, vol., no., pp.70-73, 2-5 Nov. 2014.